Jay Arre Toque

Sabia Inc
Kyoto, Japan
Dr. Jay Arre Toque is currently the Chief Technical Officer of Sabia Inc. He has doctoral degree from the Graduate School of Engineering at Kyoto University, specializing in developing high-resolution analytical imaging technology. He was a JSPS postdoctoral fellow for two years before joining Sabia Inc in early 2014. He was a former Assistant Professor at the Department of Mechanical Engineering, University of the Philippines-Diliman from 2007-2012. His current research interests include multispectral and hyperspectral imaging, digital archiving and scientific recording. He has been involved in more than a dozen of high-profile projects in digitization and analytical imaging of cultural heritage at different museums, universities and institutions in many countries across four continents which include Victoria and Albert Museum (London, UK); Prado Museum (Madrid, Spain); Philadelphia Museum of Art (Philadelphia, USA); Nicholas Roerich Museum (New York. USA); City University of Hong Kong (Hong Kong, China); Chiesa San Filippo Neri (Turin, Italy); National Museum (Manila, Philippines); National Museum Northern Ireland (Belfast, UK); Grand Egyptian Museum Conservation Center (Egypt); Kookmin University (Seoul, Korea); Tokyo National Museum (Tokyo, Japan); Kyushu National Museum (Kyushu, Japan); Science Museum (London, UK) and many more others. He holds a bachelor’s degree in Mechanical Engineering from the University of the Philippines and a master’s degree in Manufacturing Engineering from the University of Malaya.